META LEARNING FOR FEW-SHOT ONE-CLASS CLASSIFICATION
Machine Learning, Computer Vision, Meta-Learning
We propose a method that can perform one-class classification given only a small number of examples from the target class and none from the others. We formulate the learning of meaningful features for one-class classification as a meta-learning problem in which the meta-training stage repeatedly simulates one-class classification, using the classification loss of the chosen algorithm to learn a feature representation. To learn these representations, we require only multiclass data from similar tasks. We show how the SVDD method can be used with our method, and also propose a simpler variant based on Prototypical Networks that obtains comparable performance, indicating that learning feature representations directly from data may be more important than which one-class algorithm we choose. We validate our approach by adapting few-shot classification datasets to the few-shot one-class classification scenario, obtaining similar results to the state-of-the-art of traditional one-class classification, and that improves upon that of one-class classification baselines employed in the few-shot setting. Moreover, as a practical application, we employ our method to the biometric task of on-device face verification. In this scenario, it compares unfavorably to the state-of-the-art metric learning technique.