Banca de DEFESA: ELIFÁ MIRANDA MASCARENHAS

Uma banca de DEFESA de MESTRADO foi cadastrada pelo programa.
DISCENTE : ELIFÁ MIRANDA MASCARENHAS
DATA : 12/07/2021
HORA: 14:00
LOCAL: Plataforma da conferência WEB - RNP
TÍTULO:

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PALAVRAS-CHAVES:

Ellipsometry, polarization, thin films, semiconductors.

PÁGINAS: 89
GRANDE ÁREA: Ciências Exatas e da Terra
ÁREA: Física
RESUMO:

 

Ellipsometry is an optical technique widely used to investigate optical properties of materials, based on the study of the change in the change in the polarization state of light when it is reflected at an interface. This polarization change is determined by the properties of the sample: thickness, complex refractive index or tensor of the dielectric function. We will use this technique to characterize developed in the Materials Laboratory (LabMat), such as: 𝑆𝑖𝑂2 / Si, 𝑆𝑛𝑂2: F on glass and 𝑀𝑜 on glass, due to its accuracy in providing information about the dielectric function, layer thickness, prohibited band width and the optical properties of these materials. Mandatory to the complex nature of the developed ones (several layers in the substrate), the process of characterizing the characteristics is incorporated by an indirect measure, without causing damage to the sample, combined with an inversion process, making it necessary to carry out a computational treatment - with the use of optimization algorithms - from the experimental data to obtain the quantities of interest. For this, an unprecedented ellipsometry software was developed in a Visual Basic (VB6) programming environment capable of processing the spectra measured experimentally by the ellipsometer and adjusting the various parameters of representative dielectric functions of the materials making up the studied device, until reaching the best update of the experimental spectra by the theoretical model.

 

MEMBROS DA BANCA:
Presidente - 1476233 - DENIS GILBERT FRANCIS DAVID
Externa à Instituição - GIOVANNA MACHADO
Interno - 1194490 - IURI MUNIZ PEPE